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Design Rationales for Fail-Operational Safety Platforms

Design Rationales for Fail-Operational Safety Platforms

Over the last several decades TU Wien and TTTech have researched reliable platforms for safety-critical cyber-physical systems. Today, the technologies resulting from this research are used in human-space programs, civil aerospace, and advanced driver assistance systems in modern cars.

In this talk Wilfried Steiner explains design rationales of three platforms:

  • Time-Triggered Ethernet (space/aerospace Domain),
  • MotionWise (automotive),
  • The Safety Co-Pilot (self-driving cars).

He highlights the similarities in the underlying technical paradigms and points out major differences.

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    Presenter

    • Wilfried Steiner is the Director of the TTTech Labs which acts as center for strategic research as well as the center for IPR management within the TTTech Group. Wilfried Steiner holds a degree of Doctor of Technical Sciences and the Venia Docendi in Computer Science, both from the Vienna University of Technology, Austria.

      His research is focused on dependable cyber-physical systems, in particular in the following domains: automotive, space, aerospace, as well as new energy and industrial automation. Wilfried Steiner designs algorithms and network protocols with real-time, dependability, and security requirements.

      Wilfried Steiner has authored and co-authored over eighty peer-reviewed scientific publications and is inventor and co-inventor of twenty-five patent families with about another ten patent families pending. Wilfried Steiner has successfully participated in multiple national and international publicly funded research projects. In particular, from 2009 to 2012 Wilfried Steiner has been awarded a Marie Curie International Outgoing Fellowship that has been hosted by SRI International in Menlo Park, CA.

      Wilfried Steiner also acted as editor for the SAE AS6802 standard (Time-Triggered Ethernet), served multiple years as voting member in the IEEE 802.1 that standardizes time-sensitive networking (TSN), and is currently member in the ISO TC 22 that develops standards for safe autonomous road vehicles.

    About the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020)

    This webinar was part of the 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020).

    DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.

    DFT 2020 | 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (dfts.org)